MicroSense designs, manufactures & supports a wide range of automated magnetic metrology tools used by the Data Storage & Semiconductor industries.
MicroSense, LLC.(USA)
http://www.microsense.net
- Polar Magneto-Optic Kerr Effect System Polar Kerr
- Polar Kerr effect-based non-destructive, non-contact measurement of the magnetic properties of PMR media
- Longitudinal Magneto-Optic Kerr Effect System KerrMapper S300 and V300
- The KerrMapper S300 and V300 perform non-contact mapping of the magnetic properties of MRAM, MR, GMR, TMR and other wafers up to 300mm
- Magnetic Thickness Mapping System DiskMapper M3
- he DiskMapper M3 measures the uniformity of critical magnetic properties, such as the remanence thickness product (Mrt), the remanence coercivity (Hr), and the remanent nucleation field (Hnr), providing feedback for deposition process control.
- Vibrating Sample Magnetometer VSM Serise
- The Vibrating Sample Magnetometers are our most versatile systems for measuring the absolute moment, coerciivty and a wide range of other magnetic properties both at room temperature and at low or high temperatures for virtually all types of magnetic materials.
