Process Equipment
Magnetic Metrology Equipment
A wide range of automated magnetic metrology tools used by the Data Storage & Semiconductor industries.
Metrology Tool
Precision Capacitive Sensors
The lowest noise performance of any commercially available capacitive sensor, achieving nanometer and even picometer resolution.
3D Surface Profilometer
Contact and/or optical based techniques AEP metrology can virtually do Surface profiling such as defect measurement.
Upgrade Kits for AFM
Long scan range upgrade kits for most large sample AFM systems. These kits work with both traditional tube scanner and decoupled scanner instrument configurations.
6-DOF Sub-Micron Precision Motion Platform
SIx degree-of-freedom anthropomorphic robot that delivers sub-micron repeatability with extended range of motion.
Confocal Laser Scanning Imager
Wide area with high speed measurement of the defect on the surface of the transparent materials.
Process Material
CNT-based transparent conductive films
CNT-based transparent inks that can be applied to substrates to create Transparent c on d uctive Films (TCF). These films will replace brittle and expensive indium tin oxide (ITO) films currently used in touch screen.
Metal Matrix Composites
Lightweight, high reliability solutions for thermal management of these devices with high thermal conductivity and low coefficient of thermal expansion.
